Project : Reduction of VDD3_ACC_DIG Failure Rate DMAIC - Story Board

undefined. [Audio] We are excited to share our experience and knowledge in the Reduction of VDD3_ACC_DIG Failure Rate project. This initiative is both a strategic imperative for our company and an opportunity to strengthen our market position. We look forward to discussing our findings and recommendations with you..

[Audio] Define the project scope objectives and requirements to ensure alignment with business goals and customer needs. Analyze the current state of the VDD3_ACC_DIG system and identify areas for improvement. Develop and validate the new design for the VDD3_ACC_DIG system. Continue to optimize the system until the desired reduction in failure rate is achieved..

[Audio] Joseph B Josafat Test Product Engineer presents the project of reducing the failure rate of VDD3_ACC_DIG through DMAIC. VDD3_ACC_DIG refers to two independent voltage regulators that supply 3.3 volts to the digital and analog blocks. An external capacitor is required for stability of each regulator. The voltage level present at the V-D-D-3 pin is crucial for proper trimming of the device. During final testing the voltage regulators were trimmed to maintain a constant voltage of 3.3 Volts while supplying voltage to the V-D-D-3 pins. Joseph B Josafat Test Product Engineer implemented D-M-A-I-C to reduce the failure rate of VDD3_ACC_DIG. The D-M-A-I-C process includes Define Measure Analyze Improve and Control. Through the Define phase Joseph B Josafat Test Product Engineer identified the root cause of the failure rate. In the Measure phase Joseph B Josafat Test Product Engineer collected data to quantify the failure rate. In the Analyze phase Joseph B Josafat Test Product Engineer used the data to determine the root cause of the failure. In the Improve phase Joseph B Josafat Test Product Engineer implemented changes to improve the reliability of VDD3_ACC_DIG. Finally in the Control phase Joseph B Josafat Test Product Engineer implemented measures to monitor and maintain the reliability of VDD3_ACC_DIG. The implementation of D-M-A-I-C has resulted in a significant reduction in the failure rate of VDD3_ACC_DIG. Joseph B Josafat Test Product Engineer hopes that this project can serve as a reference for other companies facing similar issues..

undefined. [Audio] The project aims to reduce the failure rate in the 50424-Brocap device from 204k units to 99k units resulting in a saving of 12k euros. This initiative is a strategic imperative for our company as it enables us to increase production output and enhance overall final test yield while also strengthening our market position. We believe this project will deliver significant benefits to our business..

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